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Apple’s Synthetic Defocus Noise Pattern: Characterization and Forensic Applications

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Publication type
Journal Article
Authors
David Vázquez-Padín, Fernando Pérez-González, Pablo Pérez-Miguélez
Date
January 2026
Publication venue
IEEE Transactions on Information Forensics and Security
DOI
10.1109/TIFS.2026.3653213
Additional Info
GitHub
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